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Review Institute of Electrical & Electronics Enginee  / 2000 Conference on Percision Electromagnetic Measurements Digest
Authors
  • John Hunter
  • Leigh Johnson
  • CONFERENCE ON PRECISION ELECTROMAGNETIC
Edition: 1st
Publication date: 2000-01-15
Dewey code: 621
List Price: $174.00
Price: $174.00

Review 2000 Conference on Percision Electromagnetic Measurements Digest / Institute of Electrical & Electronics Enginee:


Creator: K. Havrilla
Publication date: 1988-09
Dewey code: 681.2
List Price: $170.00
Price: $170.00

Review Intelligent Measurement: Proceedings (Imeko Tc Event Series, No. 10) / Nova Science Pub Inc:


Creator: IEEE Industry Applications Society
Edition: 1997
Publication date: 1997-12
Dewey code: 621
List Price: $242.00
Price: $242.00

Review 1997 23rd Annual Conference of the Industrial Electronics Society - Iecon / Institute of Electrical & Electronics Enginee:

With the dynamic global environment, rapid technology changes, the need for updated management skills will be of paramount importance. This conference focuses on applications of electronics in industry, especially in the areas of control and instrumentation.

Review Springer  / Testing of Communicating Systems: Methods and Applications (IFIP International Federation for Information Processing) Creator: Katalin Tarnay
Edition: 1
Publication date: 1999-07-31
Dewey code: 004.620287
List Price: $247.00
Price: $197.60

Review Testing of Communicating Systems: Methods and Applications (IFIP International Federation for Information Processing) / Springer:

Testing of Communicating Systems presents the latest worldwide results in both the theory and practice of the testing of communicating systems. This volume provides a forum that brings together the substantial volume of research on the testing of communicating systems, ranging from conference testing through interoperability testing to performance and QoS testing. The following topics are discussed in detail: + Types of testing; + Phases of the testing process; + Classes of systems to be tested; and + Theory and practice of testing. This book contains the selected proceedings of the 12th International Workshop on the Testing of Communicating Systems (formerly the International Workshop on Protocol Test Systems), sponsored by the International Federation for Information Processing (IFIP), and held in Budapest, Hungary, in September 1999. The book contains not only interesting research on testing different communication technologies from telecom and datacom systems to distributed systems, but also presents reports on the application of these results in industry. Testing of Communicating Systems will be essential reading for engineers, IT managers and research personnel working in computer science and telecommunications.

Review Springer  / Reasoning in Boolean Networks: Logic Synthesis and Verification Using Testing Techniques (Frontiers in Electronic Testing) Edition: 1st
Publication date: 1997-06-30
Dewey code: 621.395
List Price: $231.00
Price: $198.95

Review Reasoning in Boolean Networks: Logic Synthesis and Verification Using Testing Techniques (Frontiers in Electronic Testing) / Springer:

Reasoning in Boolean Networks provides a detailed treatment of recent research advances in algorithmic techniques for logic synthesis, test generation and formal verification of digital circuits. The book presents the central idea of approaching design automation problems for logic-level circuits by specific Boolean reasoning techniques. While Boolean reasoning techniques have been a central element of two-level circuit theory for many decades Reasoning in Boolean Networks describes a basic reasoning methodology for multi-level circuits. This leads to a unified view on two-level and multi-level logic synthesis. The presented reasoning techniques are applied to various CAD-problems to demonstrate their usefulness for today's industrially relevant problems. Reasoning in Boolean Networks provides lucid descriptions of basic algorithmic concepts in automatic test pattern generation, logic synthesis and verification and elaborates their intimate relationship to provide further intuition and insight into the subject. Numerous examples are provide for ease in understanding the material. Reasoning in Boolean Networks is intended for researchers in logic synthesis, VLSI testing and formal verification as well as for integrated circuit designers who want to enhance their understanding of basic CAD methodologies.

Authors
  • IEEE Instrumentation & Measurement Society
Publication date: 1994-07
List Price: $176.00
Price: $176.00

Review Conference Proceedings: Imtc/94 Advanced Technologies in I & M : Grand Hotel Hamamatsu Hamamatsu, Japan May 10-12, 1994 / Ieee:


Authors
  • N. J.) International Test Conference (30th : 1999 : Atlantic City
Edition: 1999
Publication date: 1999-09
Dewey code: 621
List Price: $216.00
Price: $216.00

Review 1999 International Test Conference (International Test Conference//Proceedings) / Institute of Electrical & Electronics Enginee:


Review Springer  / Sensor Technology in the Netherlands: State of the Art Creator: Piet Bergveld
Edition: 1
Publication date: 1998-02-28
Dewey code: 681.209492
List Price: $209.00
Price: $167.20

Review Sensor Technology in the Netherlands: State of the Art / Springer:

In the rapidly developing information society there is an ever-growing demand for information-supplying elements or sensors. The technology to fabricate such sensors has grown in the past few decades from a skilful activity to a mature area of scientific research and technological development. In this process, the use of silicon-based techniques has appeared to be of crucial importance, as it introduced standardized (mass) fabrication techniques, created the possibility of integrated electronics, allowed for new transduction principles, and enabled the realization of micromechanical structures for sensing or actuation. Such micromechanical structures are particularly well-suited to realize complex microsystems that improve the performance of individual sensors. Currently, a variety of sensor areas ranging from optical to magnetic and from micromechanical to (bio)chemical sensors has reached a high level of sophistication. In this MESA Monograph the proceedings of the Dutch Sensor Conference, an initiative of the Technology Foundation (STW), held at the University of Twente on March 2-3, 1998, are compiled. It comprises all the oral and poster contributions of the conference, and gives an excellent overview of the state of the art of Dutch sensor research and development. Apart from Dutch work, the contributions of two external invited experts from Switzerland are included.

Review Springer  / Testing of Communicating Systems XIV - Applications to Internet Technologies and Services (IFIP INTERNATIONAL FEDERATION FOR INFORMATION PROCESSING Volume ... in Information and Communication Technology) Creator: Adam Wolisz
Edition: 1
Publication date: 2002-03-31
Dewey code: 621.382
List Price: $234.00
Price: $187.95

Review Testing of Communicating Systems XIV - Applications to Internet Technologies and Services (IFIP INTERNATIONAL FEDERATION FOR INFORMATION PROCESSING Volume ... in Information and Communication Technology) / Springer:

Testing of Communicating Systems XIV presents the latest international results in both the theory and industrial practice of the testing of communicating systems, ranging from tools and techniques for testing to test standards, frameworks, notations, algorithms, fundamentals of testing, and industrial experiences and issues. The tools and techniques discussed apply to conformance testing, interoperability testing, performance testing, Internet protocols and applications, and multimedia and distributed systems in general. The topics covered in this volume include: + Testing TCP/IP; + Testing Internet systems; + Interoperability testing; + Test automation; + Test generation and selection; + Testing distributed systems; + FSM-based testing; + Applications of TTCN-3; and + Industrial sessions. This volume contains the papers presented at the 14th International Conference on Testing of Communicating Systems (TestCom 2002), which was sponsored by the International Federation for Information Processing (IFIP) and held in Berlin, Germany, in March 2002. The conference program presents the state of the art in research concerning the testing of communicating systems. This is an important research area in the development of computer networks and distributed applications where much activity is currently in progress. The TestCom series of conferences is one of the main international forums where these important findings are reported. Testing of Communicating Systems XIV is essential reading for engineers, designers, managers of IT products and services, and all researchers interested in advancing the technology of engineering Internet frameworks, systems, services, and applications for reliability and quality.

Review CRC  / Handbook of Silicon Semiconductor Metrology Creator: Alain C. Diebold
Edition: 1
Publication date: 2001-06-29
Dewey code: 621.38152
List Price: $229.95
Price: $183.96

Review Handbook of Silicon Semiconductor Metrology / CRC:

A complete reference on silicon semiconductor metrology. Contains nearly 1300 references, more than 300 equations, and nearly 500 drawings, photographs and micrographs. Explains run-to-run and real-time control, considers how to improve physical measurement methods to meet more exact requirements, and more.

Review Springer  / Silicon Sensors and Circuits: On-chip compatibility Creator: R.F. Wolffenbuttel
Edition: 1
Publication date: 1995-11-30
Dewey code: 621
List Price: $269.00
Price: $215.20

Review Silicon Sensors and Circuits: On-chip compatibility / Springer:

Silicon sensors integrated with readout circuits on one chip are now being considered for a wide and growing range of applications. Technological compatibility constraints and the need for economic large-scale production are now the major concerns if these devices are to become widely used in industry and medicine. This is the first book to attempt to evaluate the real prospects and limitations of integrated silicon smart sensors. It provides a thorough introduction to and review of, the field, covering both technical and economic issues critical to the future success of this technology.

Authors
  • Russia) International Conference on Actual Problems of Electronic Instrument Engineering (5th : 2000 : Novosibirsk
Edition: illustrated edition
Publication date: 2000-11
Dewey code: 621.381
List Price: $162.00
Price: $162.00

Review 2000 5th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings Apeie-2000: Engineering Proceedings : Apeie-2000 ... University, Novosibirsk, 2000 : In 7 Volumes / Institute of Electrical & Electronics Enginee:


Review Springer  / Esd Program Management: A Realistic Approach to Continuous Measurable Improvement in Static Control Edition: 2nd
Publication date: 1990-09-30
Dewey code: 621.381
List Price: $229.00
Price: $183.20

Review Esd Program Management: A Realistic Approach to Continuous Measurable Improvement in Static Control / Springer:

This is a comprehensive guide to developing, implementing, and managing an ESD programme. Consultant Ted Dangelmayer taps his experience as the developer of an internationally recognized ESD control programme for AT&T, offering proven methods used to boost product yields, increase profits, improve product reliability, and enhance your company's image. It explains how to adopt management techniques for indivual ESD programmes - use an auditing programme that provides better deployment of resources and strengthens the training programme, thus avoiding common roadblocks in building an ESD programme.

Edition: 1997
Publication date: 1998-01
Dewey code: 621
List Price: $374.00
Price: $374.00

Review 1997 IEEE Industry Applications Society Conference / Institute of Electrical & Electronics Enginee:

Power control of industrial processes is the major focus of the papers presented at the 1997 IEEE Industry Applications Society Conference which are covered in this text.

Review Springer  / Boundary-Scan Interconnect Diagnosis Edition: 1
Publication date: 2001-02-28
Dewey code: 621.381
List Price: $229.00
Price: $183.20

Review Boundary-Scan Interconnect Diagnosis / Springer:

Explains how to use boundary-can to synthesize digital sequences for wire interconnects and to assess the quality of those sequences, with the aim of designing complex electronic systems using pre-designed intellectual property cores. Surveys all existing methods and proposes new ones.

Review CRC  / Handbook of Silicon Semiconductor Metrology Creator: Alain C. Diebold
Edition: 1
Publication date: 2001-06-29
Dewey code: 621.38152
List Price: $249.95
Price: $235.00

Review Handbook of Silicon Semiconductor Metrology / CRC:

A complete reference on silicon semiconductor metrology. Contains nearly 1300 references, more than 300 equations, and nearly 500 drawings, photographs and micrographs. Explains run-to-run and real-time control, considers how to improve physical measurement methods to meet more exact requirements, and more.

Creator: International Electron Devices Meeting
Publication date: 2001-05
Dewey code: 621
List Price: $216.00
Price: $216.00

Review 2000 International Electron Devices Meeting / Institute of Electrical & Electronics Enginee:

This CD-ROM contains the papers from the International Electron Devices Meeting (IEDM) held in 2000. They explore: design; manufacturing; physics and modelling of semiconductors and other electron devices; novel micromachined devices; smart power technologies; and more.

Authors
  • Canada) IEEE Instrumentation and Measurement Technology Conference (1997 : Ottawa
Publication date: 1998-01
Dewey code: 621
List Price: $210.00
Price: $210.00

Review 1997 IEEE Instrumentation and Measurement Technology Conference / Institute of Electrical & Electronics Enginee:

The IMTC is an international conference with participation from industry, government and academia. It examines trends and developments in instrumentation, testing, control and measurement technology. This volume contains the proceedings from the 1997 conference.

Review Elsevier Science  / Measuring Current, Voltage and Power (Handbook of Sensors and Actuators)
Authors
  • W. Hoornaert
  • K. Iwansson
  • G. Sinapius
  • S. Middelhoek
Publication date: 1999-06-01
Dewey code: 621.37
List Price: $218.00
Price: $213.69

Review Measuring Current, Voltage and Power (Handbook of Sensors and Actuators) / Elsevier Science:

Hardbound. This authoritative new book focuses on recent developments in the instrumentation for sending voltages and currents. It covers new trends and challenges in the field, such as measurements of biocurrents, the increased speed of the components for data taking, testing of computers and integrated circuits where the measurement of rapid voltage and current variations on a very small geometrical scale is necessary. The first chapter concentrates on recent methods to sense voltages and currents, while the rest of the book investigates the applied side, covering for instance electrical power and energy measurements. The main purpose of this volume is to illustrate commonly employed techniques rather than track the scientific evolution and merits and therefore mainly covers patent literature aimed at industrial applications. It is an exciting addition, justifying the series' claim to cover state-of-the-art developments in both the applied and theore.

Creator: L.H. Luessen
Edition: 1
Publication date: 1986-03-31
Dewey code: 621.37
List Price: $349.00
Price: $349.00

Review Fast Electrical and Optical Measurements: Volume 1 - Current and Voltage Measurements Volume 2 - Optical Measurements (NATO Science Series E:) / Springer:


Models & Brands:
2000 Conference on Percision Electromagnetic Measurements Digest, Intelligent Measurement: Proceedings (Imeko Tc Event Series, No. 10), 1997 23rd Annual Conference of the Industrial Electronics Society - Iecon, Testing of Communicating Systems: Methods and Applications (IFIP International Federation for Information Processing), Reasoning in Boolean Networks: Logic Synthesis and Verification Using Testing Techniques (Frontiers in Electronic Testing), Conference Proceedings: Imtc/94 Advanced Technologies in I & M : Grand Hotel Hamamatsu Hamamatsu, Japan May 10-12, 1994, 1999 International Test Conference (International Test Conference//Proceedings), Sensor Technology in the Netherlands: State of the Art, Testing of Communicating Systems XIV - Applications to Internet Technologies and Services (IFIP INTERNATIONAL FEDERATION FOR INFORMATION PROCESSING Volume ... in Information and Communication Technology), Handbook of Silicon Semiconductor Metrology, Silicon Sensors and Circuits: On-chip compatibility, 2000 5th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings Apeie-2000: Engineering Proceedings : Apeie-2000 ... University, Novosibirsk, 2000 : In 7 Volumes, Esd Program Management: A Realistic Approach to Continuous Measurable Improvement in Static Control, 1997 IEEE Industry Applications Society Conference, Boundary-Scan Interconnect Diagnosis, Handbook of Silicon Semiconductor Metrology, 2000 International Electron Devices Meeting, 1997 IEEE Instrumentation and Measurement Technology Conference, Measuring Current, Voltage and Power (Handbook of Sensors and Actuators), Fast Electrical and Optical Measurements: Volume 1 - Current and Voltage Measurements Volume 2 - Optical Measurements (NATO Science Series E:)

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